Skip to Main content Skip to Navigation
Journal articles

Cross-talk artefacts in Kelvin probe force microscopy imaging : a comprehensive study

Abstract : We provide in this article a comprehensive study of the role of ac cross-talk effects in Kelvin Probe Force Microscopy (KPFM), and their consequences onto KPFM imaging. The dependence of KPFM signals upon internal parameters such as the cantilever excitation frequency and the projection angle of the KPFM feedback loop is reviewed, and compared with an analytical model. We show that ac cross-talks affect the measured KPFM signals as a function of the tip-substrate distance, and thus hamper the measurement of three-dimensional KPFM signals. The influence of ac cross-talks is also demonstrated onto KPFM images, in the form of topography footprints onto KPFM images, especially in the constant distance (lift) imaging mode. Our analysis is applied to unambiguously probe charging effects in tobacco mosaic viruses (TMVs) in ambient air. TMVs are demonstrated to be electrically neutral when deposited on silicon dioxide surfaces, but inhomogeneously negatively charged when deposited on a gold surface.
Complete list of metadata

https://hal.archives-ouvertes.fr/hal-00981142
Contributor : Collection IEMN Connect in order to contact the contributor
Submitted on : Wednesday, May 25, 2022 - 9:39:11 AM
Last modification on : Monday, May 30, 2022 - 1:49:33 PM

File

Barbet_2014_1.4870710.pdf
Publisher files allowed on an open archive

Identifiers

Citation

Sophie Barbet, Michka Popoff, Heinrich Diesinger, D. Deresmes, Didier Theron, et al.. Cross-talk artefacts in Kelvin probe force microscopy imaging : a comprehensive study. Journal of Applied Physics, American Institute of Physics, 2014, 115 (14), pp.144313. ⟨10.1063/1.4870710⟩. ⟨hal-00981142⟩

Share

Metrics

Record views

71

Files downloads

4