Optical Sectioning and High Resolution in Single-Slice Structured Illumination Microscopy by Thick Slice Blind-SIM Reconstruction

Abstract : The microscope image of a thick fluorescent sample taken at a given focal plane is plagued by out-of-focus fluorescence and diffraction limited resolution. In this work, we show that a single slice of Structured Illumination Microscopy (two or three beam SIM) data can be processed to provide an image exhibiting tight sectioning and high transverse resolution. Our reconstruction algorithm is adapted from the blind-SIM technique which requires very little knowledge of the illumination patterns. It is thus able to deal with illumination distortions induced by the sample or illumination optics. We named this new algorithm thick slice blind-SIM because it models a three-dimensional sample even though only a single two-dimensional plane of focus was measured.
Complete list of metadatas

Cited literature [17 references]  Display  Hide  Download

https://hal-amu.archives-ouvertes.fr/hal-01199875
Contributor : Administrateur Hal Amu <>
Submitted on : Wednesday, September 16, 2015 - 12:45:37 PM
Last modification on : Thursday, July 11, 2019 - 2:10:07 PM
Long-term archiving on : Tuesday, December 29, 2015 - 7:30:54 AM

File

fetchObject.pdf
Publisher files allowed on an open archive

Identifiers

Collections

Citation

Aurélie Jost, Elen Tolstik, Polina Feldmann, Kai Wicker, Anne Sentenac, et al.. Optical Sectioning and High Resolution in Single-Slice Structured Illumination Microscopy by Thick Slice Blind-SIM Reconstruction. PLoS ONE, Public Library of Science, 2015, 10, pp.e0132174. ⟨10.1371/journal.pone.0132174⟩. ⟨hal-01199875⟩

Share

Metrics

Record views

239

Files downloads

229