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Statistical evidence of strain induced breaking of metallic point contacts

Abstract : A Scanning Tunneling Microscopy in Break Junction regime and a Mechanically Controllable Break Junction are used to acquire thousands of conductance-elongation curves by stretching until breaking and reconnecting Au junctions. From a robust statistical analysis performed on large sets of experiments , parameters such as lifetime, elongation and occurrence probabilities are extracted. The analysis of results obtained for different stretching speeds of the electrodes indicates that the breaking mechanism of di-and mono-atomic junction is identical, and that the junctions undergo atomic rearrangement during their stretching and at the moment of breaking. PACS. 73.63.Rt electronic transport in nanocontacts – 81.07.Lk fabrication of nanocontacts
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https://hal-amu.archives-ouvertes.fr/hal-01424938
Contributor : Hubert Klein <>
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Last modification on : Tuesday, February 11, 2020 - 3:02:02 PM
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M Alwan, N Candoni, Philippe Dumas, H Klein. Statistical evidence of strain induced breaking of metallic point contacts. European Physical Journal B: Condensed Matter and Complex Systems, Springer-Verlag, 2013, 86, pp.243. ⟨10.1140/epjb/e2013-40040-5⟩. ⟨hal-01424938⟩

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