Journal articles
Statistical evidence of strain induced breaking of metallic point contacts
Abstract : A Scanning Tunneling Microscopy in Break Junction regime and a Mechanically Controllable Break Junction are used to acquire thousands of conductance-elongation curves by stretching until breaking and reconnecting Au junctions. From a robust statistical analysis performed on large sets of experiments , parameters such as lifetime, elongation and occurrence probabilities are extracted. The analysis of results obtained for different stretching speeds of the electrodes indicates that the breaking mechanism of di-and mono-atomic junction is identical, and that the junctions undergo atomic rearrangement during their stretching and at the moment of breaking. PACS. 73.63.Rt electronic transport in nanocontacts – 81.07.Lk fabrication of nanocontacts
https://hal-amu.archives-ouvertes.fr/hal-01424938
Contributor : Hubert Klein <>
Submitted on : Tuesday, January 3, 2017 - 10:29:03 AM
Last modification on : Tuesday, February 11, 2020 - 3:02:02 PM
Long-term archiving on: : Tuesday, April 4, 2017 - 1:10:54 PM
Contributor : Hubert Klein <>
Submitted on : Tuesday, January 3, 2017 - 10:29:03 AM
Last modification on : Tuesday, February 11, 2020 - 3:02:02 PM
Long-term archiving on: : Tuesday, April 4, 2017 - 1:10:54 PM
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