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Charge Collection Physical Modeling for Soft Error Rate Computational Simulation in Digital Circuits

Abstract : This chapter describes a new computational approach for accurately modeling radiation-induced single-event transient current and charge collection at circuit level. This approach, called random-walk drift-diffusion (RWDD), is a fast Monte Carlo particle method based on a random-walk process that takes into account both diffusion and drift of carriers in a non-constant electric field both in space and time. After introducing the physical insights of the RWDD model, the chapter details the practi‐ cal implementation of the method using an object-oriented programming language and its parallelization on graphical processing units. Besides, the capability of the ap‐ proach to treat multiple node charge collection is presented. The chapter also details the coupling of the model either with an internal routine or with SPICE for circuit solving. Finally, the proposed approach is illustrated at device and circuit level, considering four different test vehicles in 65 nm technologies: a stand-alone transistor, a CMOS inverter, a SRAM cell and a flip-flop circuit. RWDD results are compared with data obtained from a full three-dimensional (3D) numerical approach (TCAD simulations) at transistor level. The importance of the circuit feedback on the charge-collection process is also demonstrated for devices connected to other circuit nodes.
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Contributor : Daniela Munteanu <>
Submitted on : Thursday, January 12, 2017 - 2:59:09 PM
Last modification on : Tuesday, April 10, 2018 - 8:46:01 AM

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Jean-Luc Autran, Daniela Munteanu, Soilihi Moindjie, Tarek Saad Saoud, Malherbe Victor, et al.. Charge Collection Physical Modeling for Soft Error Rate Computational Simulation in Digital Circuits. N. Sher Akbar, O. Anwar Beg. Modeling and Simulation in Engineering Sciences, INTECH, pp.115-137 2016, 978-953-51-2609-6. ⟨10.5772/64277⟩. ⟨hal-01433126⟩



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