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Effect Of Short Pulsed Program/Erase Cycling On Flash Memory Devices

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https://hal-amu.archives-ouvertes.fr/hal-01437034
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Submitted on : Monday, January 16, 2017 - 9:41:26 PM
Last modification on : Monday, May 14, 2018 - 4:36:07 PM

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  • HAL Id : hal-01437034, version 1

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P. Chiquet, J. Postel-Pellerin, C. Tuninetti, S. Souiki-Figuigui, P. Masson. Effect Of Short Pulsed Program/Erase Cycling On Flash Memory Devices. Workshop on New Perspectives in Measurements, Tools and Techniques for system’s reliability, maintainability and safety, Jun 2016, Milan, Italy. ⟨hal-01437034⟩

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