P. Chiquet, J. Postel-Pellerin, C. Tuninetti, S. Souiki-Figuigui, P. Masson. Effect Of Short Pulsed Program/Erase Cycling On Flash Memory Devices.
Workshop on New Perspectives in Measurements, Tools and Techniques for system’s reliability, maintainability and safety, Jun 2016, Milan, Italy.
⟨hal-01437034⟩