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Effect Of Short Pulsed Program/Erase Cycling On Flash Memory Devices

P. Chiquet 1 J. Postel-Pellerin 1 C. Tuninetti S. Souiki-Figuigui 1 P. Masson 
1 IM2NP - Institut des Matériaux, de Microélectronique et des Nanosciences de Provence
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Conference papers
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https://hal-amu.archives-ouvertes.fr/hal-01437034
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Submitted on : Monday, January 16, 2017 - 9:41:26 PM
Last modification on : Wednesday, November 3, 2021 - 7:27:42 AM

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  • HAL Id : hal-01437034, version 1

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UNIV-TLN | CNRS | UNIV-AMU | IM2NP

Citation

P. Chiquet, J. Postel-Pellerin, C. Tuninetti, S. Souiki-Figuigui, P. Masson. Effect Of Short Pulsed Program/Erase Cycling On Flash Memory Devices. Workshop on New Perspectives in Measurements, Tools and Techniques for system’s reliability, maintainability and safety, Jun 2016, Milan, Italy. ⟨hal-01437034⟩

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