Effect Of Short Pulsed Program/Erase Cycling On Flash Memory Devices

P. Chiquet; J. Postel-Pellerin; C. Tuninetti; S. Souiki-Figuigui; P. Masson

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Effect Of Short Pulsed Program/Erase Cycling On Flash Memory Devices

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1

P. Chiquet

Function : Author
PersonId : 19432
IdHAL : philippe-chiquet
ORCID : 0000-0002-1064-5246
IdRef : 169253902

Institut des Matériaux, de Microélectronique et des Nanosciences de Provence

J. Postel-Pellerin

Function : Author
PersonId : 18579
IdHAL : jeremy-postel-pellerin
ORCID : 0000-0002-4094-0190
IdRef : 134636317

Institut des Matériaux, de Microélectronique et des Nanosciences de Provence

CV

C. Tuninetti

Function : Author

S. Souiki-Figuigui

Function : Author

Institut des Matériaux, de Microélectronique et des Nanosciences de Provence

P. Masson

Function : Author

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Engineering Sciences [physics] Micro and nanotechnologies/Microelectronics

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https://hal-amu.archives-ouvertes.fr/hal-01437034

Submitted on : Monday, January 16, 2017-9:41:26 PM

Last modification on : Friday, March 24, 2023-2:53:03 PM

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hal-01437034 , version 1 (16-01-2017)

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HAL Id : hal-01437034 , version 1

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P. Chiquet, J. Postel-Pellerin, C. Tuninetti, S. Souiki-Figuigui, P. Masson. Effect Of Short Pulsed Program/Erase Cycling On Flash Memory Devices. Workshop on New Perspectives in Measurements, Tools and Techniques for system’s reliability, maintainability and safety, Jun 2016, Milan, Italy. ⟨hal-01437034⟩

Effect Of Short Pulsed Program/Erase Cycling On Flash Memory Devices

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