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Investigation by in situ X-ray imaging of grain competition and defect formation during the growth of silicon for photovoltaic applications

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Conference papers
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https://hal-amu.archives-ouvertes.fr/hal-01452446
Contributor : Im2np Bibliométrie <>
Submitted on : Wednesday, February 1, 2017 - 9:57:52 PM
Last modification on : Friday, March 29, 2019 - 10:36:05 AM

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  • HAL Id : hal-01452446, version 1

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M.G. Tsoutsouva, T. Riberi-Béridot, G. Reinhart, G. Regula, J. Baruchel, et al.. Investigation by in situ X-ray imaging of grain competition and defect formation during the growth of silicon for photovoltaic applications . GDR SAM 2016, Dec 2016, Grenoble, France. ⟨hal-01452446⟩

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