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From global and local Ge integration approaches on Si(001): Novel insights by advanced synchrotron-based scanning XRD

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https://hal-amu.archives-ouvertes.fr/hal-01453093
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Submitted on : Thursday, February 2, 2017 - 3:32:47 PM
Last modification on : Thursday, March 15, 2018 - 4:56:07 PM

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  • HAL Id : hal-01453093, version 1

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M. H. Zoellner, G. Chahine, M.I. Richard, P. Zaumseil, C. Reich, et al.. From global and local Ge integration approaches on Si(001): Novel insights by advanced synchrotron-based scanning XRD. 13th Biennial Conference on High Resolution X-Ray Diffraction and Imaging (XTOP2016), Sep 2016, Brno, Czech Republic. ⟨hal-01453093⟩

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