HAL will be down for maintenance from Friday, June 10 at 4pm through Monday, June 13 at 9am. More information
Skip to Main content Skip to Navigation
Conference papers

From global and local Ge integration approaches on Si(001): Novel insights by advanced synchrotron-based scanning XRD

Complete list of metadata

https://hal-amu.archives-ouvertes.fr/hal-01453093
Contributor : Im2np Bibliométrie Connect in order to contact the contributor
Submitted on : Thursday, February 2, 2017 - 3:32:47 PM
Last modification on : Wednesday, November 3, 2021 - 7:28:36 AM

Identifiers

  • HAL Id : hal-01453093, version 1

Collections

Citation

M. H. Zoellner, G. Chahine, M.I. Richard, P. Zaumseil, C. Reich, et al.. From global and local Ge integration approaches on Si(001): Novel insights by advanced synchrotron-based scanning XRD. 13th Biennial Conference on High Resolution X-Ray Diffraction and Imaging (XTOP2016), Sep 2016, Brno, Czech Republic. ⟨hal-01453093⟩

Share

Metrics

Record views

60