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In situ nano-mechanical testing in the light of synchrotron X-ray diffraction

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Engineering Sciences [physics] Micro and nanotechnologies/Microelectronics

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https://hal-amu.archives-ouvertes.fr/hal-01453236

Submitted on : Thursday, February 2, 2017-4:23:36 PM

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hal-01453236 , version 1 (02-02-2017)

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  • HAL Id : hal-01453236 , version 1

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T. Cornelius. In situ nano-mechanical testing in the light of synchrotron X-ray diffraction. 13th Biennial Conference on High Resolution X-Ray Diffraction and Imaging (XTOP2016), Sep 2016, Brno, Czech Republic. ⟨hal-01453236⟩

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