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In situ nano-mechanical tests in the light of synchrotron X-ray diffraction

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https://hal-amu.archives-ouvertes.fr/hal-01453251
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Submitted on : Thursday, February 2, 2017 - 4:30:53 PM
Last modification on : Wednesday, May 16, 2018 - 3:20:04 PM

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  • HAL Id : hal-01453251, version 1

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T.W. Cornelius, Z. Ren, M. Dupraz, G. Beutier, M. Verdier, et al.. In situ nano-mechanical tests in the light of synchrotron X-ray diffraction. Meeting of the French Crystallography Association (AFC 2016), Jul 2016, Marseille, France. ⟨hal-01453251⟩

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