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https://hal-amu.archives-ouvertes.fr/hal-01453251
Submitted on : Thursday, February 2, 2017-4:30:53 PM
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- HAL Id : hal-01453251 , version 1
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T.W. Cornelius, Z. Ren, M. Dupraz, G. Beutier, M. Verdier, et al.. In situ nano-mechanical tests in the light of synchrotron X-ray diffraction. Meeting of the French Crystallography Association (AFC 2016), Jul 2016, Marseille, France. ⟨hal-01453251⟩
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