In situ nano-mechanical tests in the light of synchrotron X-ray diffraction

T.W. Cornelius; Z. Ren; M. Dupraz; G. Beutier; M. Verdier; E. Rabkin; G. Richter; O. Thomas

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In situ nano-mechanical tests in the light of synchrotron X-ray diffraction

(1) , , , , , , , (1)

1

T.W. Cornelius

Function : Author
PersonId : 18168
IdHAL : thcornelius
ORCID : 0000-0003-4272-4720
IdRef : 200023373

Institut des Matériaux, de Microélectronique et des Nanosciences de Provence

CV

Z. Ren

Function : Author

M. Dupraz

Function : Author

G. Beutier

Function : Author

M. Verdier

Function : Author
PersonId : 742072
IdHAL : marc-verdier
ORCID : 0000-0003-0563-2675
IdRef : 123967678

E. Rabkin

Function : Author

G. Richter

Function : Author

O. Thomas

Function : Author

Institut des Matériaux, de Microélectronique et des Nanosciences de Provence

Domains

Engineering Sciences [physics] Micro and nanotechnologies/Microelectronics

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Submitted on : Thursday, February 2, 2017-4:30:53 PM

Last modification on : Wednesday, November 3, 2021-7:39:56 AM

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hal-01453251 , version 1 (02-02-2017)

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HAL Id : hal-01453251 , version 1

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T.W. Cornelius, Z. Ren, M. Dupraz, G. Beutier, M. Verdier, et al.. In situ nano-mechanical tests in the light of synchrotron X-ray diffraction. Meeting of the French Crystallography Association (AFC 2016), Jul 2016, Marseille, France. ⟨hal-01453251⟩

In situ nano-mechanical tests in the light of synchrotron X-ray diffraction

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