In situ nano-mechanical tests in the light of synchrotron X-ray diffraction

T.W. Cornelius; Z. Ren; M. Dupraz; G. Beutier; M. Verdier; E. Rabkin; G. Richter; O. Thomas

Conference papers

In situ nano-mechanical tests in the light of synchrotron X-ray diffraction

T.W. Cornelius ¹ Z. Ren M. Dupraz G. Beutier M. Verdier E. Rabkin G. Richter O. Thomas ¹

1 IM2NP - Institut des Matériaux, de Microélectronique et des Nanosciences de Provence

Document type :

Conference papers

Domain :

Engineering Sciences [physics] / Micro and nanotechnologies/Microelectronics

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https://hal-amu.archives-ouvertes.fr/hal-01453251
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Submitted on : Thursday, February 2, 2017 - 4:30:53 PM
Last modification on : Monday, March 29, 2021 - 3:08:05 PM

In situ nano-mechanical tests in the light of synchrotron X-ray diffraction

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In situ nano-mechanical tests in the light of synchrotron X-ray diffraction

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