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https://hal-amu.archives-ouvertes.fr/hal-01453356
Submitted on : Thursday, February 2, 2017-4:58:46 PM
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- HAL Id : hal-01453356 , version 1
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A. Fraczkiewicz, E. Capria, G. Chahine, P. Cloetens, J. Da Silva, et al.. 3D morphological and structural nano-characterization for microelectronics: the potential of recent, long synchrotron beamlines. X-Ray Microscopy Conference (XRM 2016), Aug 2016, Oxford, United Kingdom. ⟨hal-01453356⟩
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