Thin Films Characterization Using Fast Data Acquisition at DiffAbs Beamline (SOLEIL)

C. Mocuta; M.-I. Richard; S. Stanescu; A. Barbier; J. Fouet; C. Guichet; S. Hustache; D. Thiaudiere; A. Dawiec; N. Leclercq; O. Thomas

Conference Papers Year :

Thin Films Characterization Using Fast Data Acquisition at DiffAbs Beamline (SOLEIL)

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1

C. Mocuta

Function : Author
PersonId : 758731
ORCID : 0000-0001-5540-449X
IdRef : 200868470

M.-I. Richard

Function : Author
PersonId : 736272
IdHAL : marie-ingrid-richard
ORCID : 0000-0002-8172-3141
IdRef : 130070289

Institut des Matériaux, de Microélectronique et des Nanosciences de Provence

CV

S. Stanescu

Function : Author

A. Barbier

Function : Author
PersonId : 17272
IdHAL : antoine-barbier
ORCID : 0000-0002-1032-299X
IdRef : 138774110

J. Fouet

Function : Author

C. Guichet

Function : Author

S. Hustache

Function : Author

D. Thiaudiere

Function : Author

A. Dawiec

Function : Author

N. Leclercq

Function : Author

O. Thomas

Function : Author

Institut des Matériaux, de Microélectronique et des Nanosciences de Provence

Domains

Engineering Sciences [physics] Micro and nanotechnologies/Microelectronics

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Submitted on : Friday, February 3, 2017-9:34:54 AM

Last modification on : Wednesday, February 8, 2023-5:11:01 PM

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hal-01454827 , version 1 (03-02-2017)

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HAL Id : hal-01454827 , version 1

Cite

C. Mocuta, M.-I. Richard, S. Stanescu, A. Barbier, J. Fouet, et al.. Thin Films Characterization Using Fast Data Acquisition at DiffAbs Beamline (SOLEIL). TAILOR 2016, Mar 2016, Fontainebleau, France. ⟨hal-01454827⟩

Thin Films Characterization Using Fast Data Acquisition at DiffAbs Beamline (SOLEIL)

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