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Prediction methodology of Single Event Effect Sensitivity and application on SRAM device

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https://hal-amu.archives-ouvertes.fr/hal-01455417
Contributor : Im2np Bibliométrie <>
Submitted on : Friday, February 3, 2017 - 3:13:11 PM
Last modification on : Tuesday, May 22, 2018 - 7:24:03 PM

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  • HAL Id : hal-01455417, version 1

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N. Andrianjohany, P. Pourrouquet, K. Castellani-Coulié, N. Chatry, W. Rahajandraibe, et al.. Prediction methodology of Single Event Effect Sensitivity and application on SRAM device. RADECS, Sep 2016, Bremen, Germany. ⟨hal-01455417⟩

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