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Prediction methodology of Single Event Effect Sensitivity and application on SRAM device

N. Andrianjohany P. Pourrouquet K. Castellani-Coulié 1 N. Chatry W. Rahajandraibe 1 D. Standarovski G. Rolland R. Ecoffet 
1 IM2NP - Institut des Matériaux, de Microélectronique et des Nanosciences de Provence
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Conference papers
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https://hal-amu.archives-ouvertes.fr/hal-01455417
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Submitted on : Friday, February 3, 2017 - 3:13:11 PM
Last modification on : Monday, December 13, 2021 - 10:16:01 PM

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  • HAL Id : hal-01455417, version 1

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UNIV-TLN | CNRS | UNIV-AMU | IM2NP

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N. Andrianjohany, P. Pourrouquet, K. Castellani-Coulié, N. Chatry, W. Rahajandraibe, et al.. Prediction methodology of Single Event Effect Sensitivity and application on SRAM device. RADECS, Sep 2016, Bremen, Germany. ⟨hal-01455417⟩

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