Prediction methodology of Single Event Effect Sensitivity and application on SRAM device

N. Andrianjohany; P. Pourrouquet; K. Castellani-Coulié; N. Chatry; W. Rahajandraibe; D. Standarovski; G. Rolland; R. Ecoffet

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Prediction methodology of Single Event Effect Sensitivity and application on SRAM device

, , (1) , , (1) , , ,

1

N. Andrianjohany

Function : Author

P. Pourrouquet

Function : Author

K. Castellani-Coulié

Function : Author
PersonId : 19592
IdHAL : karine-coulie
IdRef : 072405902

Institut des Matériaux, de Microélectronique et des Nanosciences de Provence

CV

N. Chatry

Function : Author

W. Rahajandraibe

Function : Author
PersonId : 751037
IdHAL : rahajandraibe-wenceslas
ORCID : 0000-0003-1508-5927

Institut des Matériaux, de Microélectronique et des Nanosciences de Provence

D. Standarovski

Function : Author

G. Rolland

Function : Author

R. Ecoffet

Function : Author

Domains

Engineering Sciences [physics] Micro and nanotechnologies/Microelectronics

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Submitted on : Friday, February 3, 2017-3:13:11 PM

Last modification on : Friday, March 24, 2023-2:53:03 PM

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hal-01455417 , version 1 (03-02-2017)

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HAL Id : hal-01455417 , version 1

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N. Andrianjohany, P. Pourrouquet, K. Castellani-Coulié, N. Chatry, W. Rahajandraibe, et al.. Prediction methodology of Single Event Effect Sensitivity and application on SRAM device. RADECS, Sep 2016, Bremen, Germany. ⟨hal-01455417⟩

Prediction methodology of Single Event Effect Sensitivity and application on SRAM device

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