Prediction methodology of Single Event Effect Sensitivity and application on SRAM device - Archive ouverte HAL Access content directly
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hal-01455417 , version 1 (03-02-2017)

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  • HAL Id : hal-01455417 , version 1

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N. Andrianjohany, P. Pourrouquet, K. Castellani-Coulié, N. Chatry, W. Rahajandraibe, et al.. Prediction methodology of Single Event Effect Sensitivity and application on SRAM device. RADECS, Sep 2016, Bremen, Germany. ⟨hal-01455417⟩
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