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Resistive RAM Variability Monitoring using a Ring Oscillator based Test Chip

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https://hal-amu.archives-ouvertes.fr/hal-01463136
Contributor : Im2np Bibliométrie <>
Submitted on : Thursday, February 9, 2017 - 1:59:04 PM
Last modification on : Wednesday, March 25, 2020 - 3:50:03 PM

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  • HAL Id : hal-01463136, version 1

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Hassen Aziza, Jean-Michel Portal. Resistive RAM Variability Monitoring using a Ring Oscillator based Test Chip. 27th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF 2016), Sep 2016, Halle, Germany. ⟨hal-01463136⟩

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