HAL will be down for maintenance from Friday, June 10 at 4pm through Monday, June 13 at 9am. More information
Skip to Main content Skip to Navigation
Conference papers

Impact of Resistive Paths on NVM Array Reliability: Application to Flash & ReRAM Memories

P. Canet 1 J. Postel-Pellerin 1 Hassen Aziza 1
1 IM2NP - Institut des Matériaux, de Microélectronique et des Nanosciences de Provence
Document type :
Conference papers
Complete list of metadata
https://hal-amu.archives-ouvertes.fr/hal-01463140
Contributor : Im2np Bibliométrie Connect in order to contact the contributor
Submitted on : Thursday, February 9, 2017 - 2:01:22 PM
Last modification on : Wednesday, November 3, 2021 - 7:28:18 AM

Identifiers

  • HAL Id : hal-01463140, version 1

Collections

UNIV-AMU | CNRS | UNIV-TLN | IM2NP

Citation

P. Canet, J. Postel-Pellerin, Hassen Aziza. Impact of Resistive Paths on NVM Array Reliability: Application to Flash & ReRAM Memories. 27th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF 2016), Sep 2016, Halle, Germany. ⟨hal-01463140⟩

Export

BibTeX TEI DC DCterms EndNote Datacite

Share

Metrics

Record views

55