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https://hal-amu.archives-ouvertes.fr/hal-01463140
Submitted on : Thursday, February 9, 2017-2:01:22 PM
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- HAL Id : hal-01463140 , version 1
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P. Canet, J. Postel-Pellerin, Hassen Aziza. Impact of Resistive Paths on NVM Array Reliability: Application to Flash & ReRAM Memories. 27th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF 2016), Sep 2016, Halle, Germany. ⟨hal-01463140⟩
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