P. Canet, J. Postel-Pellerin, Hassen Aziza. Impact of Resistive Paths on NVM Array Reliability: Application to Flash & ReRAM Memories.
27th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF 2016), Sep 2016, Halle, Germany.
⟨hal-01463140⟩