A. Bravaix, F. Cacho, X. Federspiel, C. Ndiaye, S. Mhira, et al.. Potentiality of Healing Techniques in Hot-Carrier Damaged 28nm FDSOI CMOS nodes.
27th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF 2016), Sep 2016, Halle, Germany.
⟨hal-01463147⟩