Fault prognosis for batch production based on percentile measure and gamma process: Application to semiconductor manufacturing
Abstract
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William Domingues Vinhas : Connect in order to contact the contributor
https://hal-amu.archives-ouvertes.fr/hal-01479265
Submitted on : Tuesday, February 28, 2017-5:08:39 PM
Last modification on : Friday, March 24, 2023-2:53:04 PM