Skip to Main content Skip to Navigation
Conference papers

Regression methods for predicting the product's quality in the semiconductor manufacturing process

Mariam Melhem Bouchra Ananou 1 Mustapha Ouladsine 1 Jacques Pinaton 2
1 LSIS - Laboratoire des Sciences de l'Information et des Systèmes
2 ST-ROUSSET - STMicroelectronics [Rousset]
Abstract : no abstract
Document type :
Conference papers
Complete list of metadatas
https://hal-amu.archives-ouvertes.fr/hal-01490154
Contributor : William Domingues Vinhas <>
Submitted on : Tuesday, March 14, 2017 - 10:24:53 PM
Last modification on : Monday, March 30, 2020 - 8:44:51 AM

Identifiers

  • HAL Id : hal-01490154, version 1

Collections

UNIV-AMU | LSIS | CNRS | UNIV-TLN | LIS-LAB | UNIV-HESAM | ARTS-ET-METIERS-SCIENCES-ET-TECHNOLOGIES

Citation

Mariam Melhem, Bouchra Ananou, Mustapha Ouladsine, Jacques Pinaton. Regression methods for predicting the product's quality in the semiconductor manufacturing process. 8th IFAC Conference on Manufacturing Modelling, Management., 2016, Troyes, Unknown Region. ⟨hal-01490154⟩

Export

BibTeX TEI DC DCterms EndNote

Share

Metrics

Record views

117