Regression methods for predicting the product's quality in the semiconductor manufacturing process - Archive ouverte HAL Access content directly
Conference Papers Year : 2016
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hal-01490154 , version 1 (14-03-2017)

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  • HAL Id : hal-01490154 , version 1

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Mariam Melhem, Bouchra Ananou, Mustapha Ouladsine, Jacques Pinaton. Regression methods for predicting the product's quality in the semiconductor manufacturing process. 8th IFAC Conference on Manufacturing Modelling, Management., 2016, Troyes, Unknown Region. ⟨hal-01490154⟩
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