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Regression methods for predicting the product's quality in the semiconductor manufacturing process

Mariam Melhem Bouchra Ananou 1 Mustapha Ouladsine 1 Jacques Pinaton 2
1 LSIS - Laboratoire des Sciences de l'Information et des Systèmes
2 ST-ROUSSET - STMicroelectronics [Rousset]
Abstract : no abstract
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Conference papers
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https://hal-amu.archives-ouvertes.fr/hal-01490154
Contributor : William Domingues Vinhas <>
Submitted on : Tuesday, March 14, 2017 - 10:24:53 PM
Last modification on : Monday, March 30, 2020 - 8:44:51 AM

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  • HAL Id : hal-01490154, version 1

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Mariam Melhem, Bouchra Ananou, Mustapha Ouladsine, Jacques Pinaton. Regression methods for predicting the product's quality in the semiconductor manufacturing process. 8th IFAC Conference on Manufacturing Modelling, Management., 2016, Troyes, Unknown Region. ⟨hal-01490154⟩

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