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Conference papers

Extended defects in semiconducting materials investigated by transmission electron microscopy: structure and mobilities

M. Texier 1
1 IM2NP - Institut des Matériaux, de Microélectronique et des Nanosciences de Provence
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Conference papers
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https://hal-amu.archives-ouvertes.fr/hal-01705353
Contributor : Im2np Bibliométrie <>
Submitted on : Friday, February 9, 2018 - 1:29:01 PM
Last modification on : Thursday, March 15, 2018 - 4:56:07 PM

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  • HAL Id : hal-01705353, version 1

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UNIV-AMU | CNRS | UNIV-TLN | IM2NP

Citation

M. Texier. Extended defects in semiconducting materials investigated by transmission electron microscopy: structure and mobilities. UNESP, Sep 2017, São Paulo Brazil. ⟨hal-01705353⟩

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