Skip to Main content Skip to Navigation
Conference papers

Extended defects in semiconducting materials investigated by transmission electron microscopy: structure and mobilities

Complete list of metadatas

https://hal-amu.archives-ouvertes.fr/hal-01705353
Contributor : Im2np Bibliométrie <>
Submitted on : Friday, February 9, 2018 - 1:29:01 PM
Last modification on : Thursday, March 15, 2018 - 4:56:07 PM

Identifiers

  • HAL Id : hal-01705353, version 1

Collections

Citation

M. Texier. Extended defects in semiconducting materials investigated by transmission electron microscopy: structure and mobilities. UNESP, Sep 2017, São Paulo Brazil. ⟨hal-01705353⟩

Share

Metrics

Record views

62