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Extended defects in semiconducting materials investigated by transmission electron microscopy: structure and mobilities

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hal-01705353 , version 1 (09-02-2018)

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  • HAL Id : hal-01705353 , version 1

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M. Texier. Extended defects in semiconducting materials investigated by transmission electron microscopy: structure and mobilities. UNESP, Sep 2017, São Paulo Brazil. ⟨hal-01705353⟩
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