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Extended defects in semiconducting materials investigated by transmission electron microscopy: structure and mobilities

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https://hal-amu.archives-ouvertes.fr/hal-01705353
Contributor : IM2NP Bibliométrie Connect in order to contact the contributor
Submitted on : Friday, February 9, 2018 - 1:29:01 PM
Last modification on : Wednesday, November 3, 2021 - 7:27:27 AM

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  • HAL Id : hal-01705353, version 1

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M. Texier. Extended defects in semiconducting materials investigated by transmission electron microscopy: structure and mobilities. UNESP, Sep 2017, São Paulo Brazil. ⟨hal-01705353⟩

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