Mechanical properties at the nanoscale: recent developments using nano-focused X-ray diffraction

O. Thomas

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Mechanical properties at the nanoscale: recent developments using nano-focused X-ray diffraction

(1)

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O. Thomas

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Institut des Matériaux, de Microélectronique et des Nanosciences de Provence

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Engineering Sciences [physics] Micro and nanotechnologies/Microelectronics

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https://hal-amu.archives-ouvertes.fr/hal-01705369

Submitted on : Friday, February 9, 2018-1:38:34 PM

Last modification on : Friday, March 24, 2023-2:53:06 PM

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hal-01705369 , version 1 (09-02-2018)

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HAL Id : hal-01705369 , version 1

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O. Thomas. Mechanical properties at the nanoscale: recent developments using nano-focused X-ray diffraction. 5th Dresden Nanoanalysis symposium , Sep 2017, Dresden, Germany. ⟨hal-01705369⟩

Mechanical properties at the nanoscale: recent developments using nano-focused X-ray diffraction

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