Skip to Main content Skip to Navigation
Conference papers

Atmospheric Pressure Chemical Vapor Deposition and characterization of TiO2 antireflection coatings for monocrystalline silicon solar cells

D. Hocine M. Pasquinelli 1 Ludovic Escoubas 1 P. Torchio 1 A. Moreau 1 Ms. Belkaid
1 IM2NP - Institut des Matériaux, de Microélectronique et des Nanosciences de Provence
Document type :
Conference papers
Complete list of metadata
https://hal-amu.archives-ouvertes.fr/hal-01758774
Contributor : Philippe Torchio Connect in order to contact the contributor
Submitted on : Wednesday, April 4, 2018 - 5:37:39 PM
Last modification on : Tuesday, October 19, 2021 - 11:00:01 PM

Identifiers

Collections

UNIV-AMU | CNRS | UNIV-TLN | IM2NP

Citation

D. Hocine, M. Pasquinelli, Ludovic Escoubas, P. Torchio, A. Moreau, et al.. Atmospheric Pressure Chemical Vapor Deposition and characterization of TiO2 antireflection coatings for monocrystalline silicon solar cells. 14th International Conference on Harmonics and Quality of Power (ICHQP'2010), Sep 2010, Ischia, France. ⟨10.1109/ICCEP.2011.6036368⟩. ⟨hal-01758774⟩

Export

BibTeX TEI DC DCterms EndNote

Share

Metrics

Record views

105