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In situ tensile tests of single Au nanowires combined with coherent X-ray diffraction

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https://hal-amu.archives-ouvertes.fr/hal-01781796
Contributor : Im2np Bibliométrie <>
Submitted on : Monday, April 30, 2018 - 5:08:23 PM
Last modification on : Wednesday, May 16, 2018 - 3:20:04 PM

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  • HAL Id : hal-01781796, version 1

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T.W. Cornelius, J. Shin, S. Labat, F. Lauraux, M.-I. Richard, et al.. In situ tensile tests of single Au nanowires combined with coherent X-ray diffraction. E-MRS Spring Meeting 2017, May 2017, Strasbourg, France. ⟨hal-01781796⟩

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