In situ tensile tests of single Au nanowires combined with coherent X-ray diffraction

T.W. Cornelius; J. Shin; S. Labat; F. Lauraux; M.-I. Richard; G. Richter; D.S. Gianola; O. Thomas

Conference papers

In situ tensile tests of single Au nanowires combined with coherent X-ray diffraction

T.W. Cornelius ¹ J. Shin S. Labat F. Lauraux M.-I. Richard ¹ G. Richter D.S. Gianola O. Thomas ¹

1 IM2NP - Institut des Matériaux, de Microélectronique et des Nanosciences de Provence

Document type :

Conference papers

Domain :

Engineering Sciences [physics] / Micro and nanotechnologies/Microelectronics

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https://hal-amu.archives-ouvertes.fr/hal-01781796
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Submitted on : Monday, April 30, 2018 - 5:08:23 PM
Last modification on : Wednesday, November 3, 2021 - 7:28:56 AM

In situ tensile tests of single Au nanowires combined with coherent X-ray diffraction

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In situ tensile tests of single Au nanowires combined with coherent X-ray diffraction

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