In situ tensile tests of single Au nanowires combined with coherent X-ray diffraction

T.W. Cornelius; J. Shin; S. Labat; F. Lauraux; M.-I. Richard; G. Richter; D.S. Gianola; O. Thomas

Conference Papers Year :

In situ tensile tests of single Au nanowires combined with coherent X-ray diffraction

(1) , , , , (1) , , , (1)

1

T.W. Cornelius

Function : Author
PersonId : 18168
IdHAL : thcornelius
ORCID : 0000-0003-4272-4720
IdRef : 200023373

Institut des Matériaux, de Microélectronique et des Nanosciences de Provence

CV

J. Shin

Function : Author
PersonId : 759391
ORCID : 0000-0003-4059-7748

S. Labat

Function : Author
PersonId : 19478
IdHAL : stephane-labat

F. Lauraux

Function : Author

M.-I. Richard

Function : Author
PersonId : 736272
IdHAL : marie-ingrid-richard
ORCID : 0000-0002-8172-3141
IdRef : 130070289

Institut des Matériaux, de Microélectronique et des Nanosciences de Provence

CV

G. Richter

Function : Author

D.S. Gianola

Function : Author

O. Thomas

Function : Author

Institut des Matériaux, de Microélectronique et des Nanosciences de Provence

Domains

Engineering Sciences [physics] Micro and nanotechnologies/Microelectronics

IM2NP Bibliométrie : Connect in order to contact the contributor

https://hal-amu.archives-ouvertes.fr/hal-01781796

Submitted on : Monday, April 30, 2018-5:08:23 PM

Last modification on : Wednesday, February 8, 2023-5:11:04 PM

Dates and versions

hal-01781796 , version 1 (30-04-2018)

Identifiers

HAL Id : hal-01781796 , version 1

Cite

T.W. Cornelius, J. Shin, S. Labat, F. Lauraux, M.-I. Richard, et al.. In situ tensile tests of single Au nanowires combined with coherent X-ray diffraction. E-MRS Spring Meeting 2017, May 2017, Strasbourg, France. ⟨hal-01781796⟩

In situ tensile tests of single Au nanowires combined with coherent X-ray diffraction

Domains

Dates and versions

Identifiers

Cite

Export

Collections

Share