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Conference papers

Study of the microstructure and stress induced during the crystallization of GeTe thin films

M. Gallard M.S. Amara F. Lauraux C. Guichet S. Escoubas 1 M.-I. Richard 1 C. Mocuta P. Noé C. Sabbione F. Hippert Magali Putero 1 N. Burle O. Thomas 1 
1 IM2NP - Institut des Matériaux, de Microélectronique et des Nanosciences de Provence
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Conference papers
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https://hal-amu.archives-ouvertes.fr/hal-01781812
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Submitted on : Monday, April 30, 2018 - 5:19:31 PM
Last modification on : Wednesday, November 3, 2021 - 7:27:42 AM

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  • HAL Id : hal-01781812, version 1

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UNIV-TLN | CNRS | UNIV-AMU | IM2NP

Citation

M. Gallard, M.S. Amara, F. Lauraux, C. Guichet, S. Escoubas, et al.. Study of the microstructure and stress induced during the crystallization of GeTe thin films. E/PCOS 2017, European Phase Change and Ovonics Symposium, Sep 2017, Aachen, Germany. ⟨hal-01781812⟩

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