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Conference papers

Study of the microstructure and stress induced during the crystallization of GeTe thin films

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Submitted on : Monday, April 30, 2018 - 5:19:31 PM
Last modification on : Wednesday, November 3, 2021 - 7:27:42 AM

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  • HAL Id : hal-01781812, version 1

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M. Gallard, M.S. Amara, F. Lauraux, C. Guichet, S. Escoubas, et al.. Study of the microstructure and stress induced during the crystallization of GeTe thin films. E/PCOS 2017, European Phase Change and Ovonics Symposium, Sep 2017, Aachen, Germany. ⟨hal-01781812⟩

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