Conference papers
Multi-Poisson Process Analysis of Real-Time Soft-Error Rate Measurements in Bulk 65nm SRAMs
Abstract : Altitude and underground real-time soft error rate (SER) measurements on SRAM circuits have been analyzed in terms of independent multi-Poisson processes describing the occurrence of single events as a function of bit flip multiplicity. Applied for both neutron-induced and alpha particle-induced SERs, this detailed analysis highlights the respective contributions of atmospheric radiation and alpha contamination to multiple cell upset mechanisms. It also offers a simple way to predict by simulation the radiation response of a given technology for any terrestrial position, as illustrated here for bulk 65nm SRAMs.
Cited literature [3 references]
https://hal-amu.archives-ouvertes.fr/hal-01787603
Contributor : Daniela Munteanu Connect in order to contact the contributor
Submitted on : Monday, May 7, 2018 - 4:44:45 PM
Last modification on : Tuesday, October 19, 2021 - 11:00:00 PM
Long-term archiving on: : Tuesday, September 25, 2018 - 4:10:05 AM
Contributor : Daniela Munteanu Connect in order to contact the contributor
Submitted on : Monday, May 7, 2018 - 4:44:45 PM
Last modification on : Tuesday, October 19, 2021 - 11:00:00 PM
Long-term archiving on: : Tuesday, September 25, 2018 - 4:10:05 AM
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ESREF_Poisson.pdf
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