Soft Errors: from particles to circuits, 2015. ,
Measurement and Reporting of Alpha Particles and Terrestrial Cosmic Ray-Induced Soft Errors in Semiconductor Devices, 2006. ,
Altitude and Underground Real-Time SER Characterization of CMOS 65 nm SRAM, IEEE Transactions on Nuclear Science, vol.56, issue.4, pp.2258-2266, 2009. ,
DOI : 10.1109/TNS.2009.2012426
URL : https://hal.archives-ouvertes.fr/hal-01430112