J. L. Autran and D. Munteanu, Soft Errors: from particles to circuits, 2015.

J. Standard, Measurement and Reporting of Alpha Particles and Terrestrial Cosmic Ray-Induced Soft Errors in Semiconductor Devices, 2006.

J. L. Autran, P. Roche, S. Sauze, G. Gasiot, D. Munteanu et al., Altitude and Underground Real-Time SER Characterization of CMOS 65 nm SRAM, IEEE Transactions on Nuclear Science, vol.56, issue.4, pp.2258-2266, 2009.
DOI : 10.1109/TNS.2009.2012426

URL : https://hal.archives-ouvertes.fr/hal-01430112