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High resolution transmission electron microscopy correlated to in-field Mössbauer spectrometry to investigate exchange coupling behavior and surface frustrated moments

Mohamed Saidani Wajdi Belkacem Loic Patout 1 Jean-Marc Greneche 2 Ahmed Charai 1 Najeh Mliki 3 
1 IM2NP - Institut des Matériaux, de Microélectronique et des Nanosciences de Provence
2 LPEC - Laboratoire de physique de l'état condensé
3 département de physique de la faculté des sciences de Tunis
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https://hal-amu.archives-ouvertes.fr/hal-01790112
Contributor : Loïc Patout Connect in order to contact the contributor
Submitted on : Friday, May 11, 2018 - 4:33:18 PM
Last modification on : Monday, January 31, 2022 - 12:09:25 PM

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UNIV-TLN | CNRS | UNIV-AMU | UNIV-LEMANS | IM2NP | IMMM-LEMANS

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Mohamed Saidani, Wajdi Belkacem, Loic Patout, Jean-Marc Greneche, Ahmed Charai, et al.. High resolution transmission electron microscopy correlated to in-field Mössbauer spectrometry to investigate exchange coupling behavior and surface frustrated moments. Acta Materialia, Elsevier, 2018, 151, pp.488 - 498. ⟨10.1016/j.actamat.2018.03.066⟩. ⟨hal-01790112⟩

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