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Data-Driven Approach for Feature Drift Detection in Embedded Electronic Devices

Abstract : This paper is a part of a project aiming to develop supervisor and monitoring devices for embedded systems in airplanes and vehicles. It focuses on the reliability of these systems and establishes a monitoring framework to detect drifts and faults in the behavior of the heterogeneous central processing units (CPU) and graphics processing units (GPU) chips powering them. In this work, we use a previously developed incremental model of these chips and associate it with a fault detection algorithm. Estimations from the model constitute inputs to the diagnosis module. The latter generates alarms in the presence of faults or drifts in the characteristics and features of the System-on-Chip (SoC). The obtained results validate the proposed monitoring algorithm and demonstrate the effectiveness of the fault detection algorithm.
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Contributor : Oussama Djedidi Connect in order to contact the contributor
Submitted on : Monday, October 22, 2018 - 3:29:08 PM
Last modification on : Friday, February 4, 2022 - 3:25:55 AM
Long-term archiving on: : Wednesday, January 23, 2019 - 3:25:43 PM



Oussama Djedidi, Mohand Djeziri, Nacer M'Sirdi. Data-Driven Approach for Feature Drift Detection in Embedded Electronic Devices. IFAC-PapersOnLine, Elsevier, 2018, 51 (24), pp.1024 - 1029. ⟨10.1016/j.ifacol.2018.09.714⟩. ⟨hal-01869747v2⟩



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