Data-Driven Approach for Feature Drift Detection in Embedded Electronic Devices

Abstract : This paper is a part of a project aiming to develop supervisor and monitoring devices for embedded systems in airplanes and vehicles. It focuses on the reliability of these systems and establishes a monitoring framework to detect drifts and faults in the behavior of the heterogeneous central processing units (CPU) and graphics processing units (GPU) chips powering them. In this work, we use a previously developed incremental model of these chips and associate it with a fault detection algorithm. Estimations from the model constitute inputs to the diagnosis module. The latter generates alarms in the presence of faults or drifts in the characteristics and features of the System-on-Chip (SoC). The obtained results validate the proposed monitoring algorithm and demonstrate the effectiveness of the fault detection algorithm.
Complete list of metadatas

Cited literature [26 references]  Display  Hide  Download

https://hal-amu.archives-ouvertes.fr/hal-01869747
Contributor : Oussama Djedidi <>
Submitted on : Monday, October 22, 2018 - 3:29:08 PM
Last modification on : Tuesday, May 21, 2019 - 2:22:03 PM
Long-term archiving on : Wednesday, January 23, 2019 - 3:25:43 PM

Identifiers

Citation

Oussama Djedidi, Mohand Djeziri, Nacer M'Sirdi. Data-Driven Approach for Feature Drift Detection in Embedded Electronic Devices. IFAC-PapersOnLine, Elsevier, 2018, 51 (24), pp.1024 - 1029. ⟨http://safeprocess18.uz.zgora.pl/⟩. ⟨10.1016/j.ifacol.2018.09.714⟩. ⟨hal-01869747v2⟩

Share

Metrics

Record views

192

Files downloads

131