A prognostic methodology for power MOSFETs under thermal stress using echo state network and particle filter

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https://hal-amu.archives-ouvertes.fr/hal-02004111
Contributor : Zhongliang Li <>
Submitted on : Friday, February 1, 2019 - 3:35:32 PM
Last modification on : Friday, May 31, 2019 - 10:18:11 AM

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Z. Li, Z. Zheng, R. Outbib. A prognostic methodology for power MOSFETs under thermal stress using echo state network and particle filter. Microelectronics Reliability, Elsevier, 2018, 88-90, pp.350-354. ⟨10.1016/j.microrel.2018.07.137⟩. ⟨hal-02004111⟩

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