How to measure accurately mass transport in thin films by AES - Archive ouverte HAL Access content directly
Journal Articles Surface and Interface Analysis Year : 2002
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hal-02045033 , version 1 (21-02-2019)

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  • HAL Id : hal-02045033 , version 1

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Christophe Girardeaux, G. Clugnet, Z. Erdélyi, J. Nyéki, J. Bernardini, et al.. How to measure accurately mass transport in thin films by AES. Surface and Interface Analysis, 2002, 34 (1), pp.389-392. ⟨hal-02045033⟩
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