Soft Errors: from particles to circuits, 2015. ,
URL : https://hal.archives-ouvertes.fr/hal-02107670
Introductory Invited Paper -Real-time soft-error rate measurements: A review, Microelectronics Reliability, vol.54, pp.1455-1476, 2014. ,
The Rosetta Experiment: Atmospheric Soft Error Rate Testing in Differing Technology FPGAs, IEEE Transactions on Device and Materials Reliability, vol.5, issue.3, pp.317-328, 2005. ,
Altitude SEE Test European Platform (ASTEP) and First Results in CMOS 130nm SRAM, IEEE Transactions on Nuclear Science, vol.54, issue.4, pp.1002-1009, 2007. ,
URL : https://hal.archives-ouvertes.fr/hal-01759445
Altitude and Underground Real-Time SER Characterization of CMOS 65nm SRAM, IEEE Transactions on Nuclear Science, vol.56, issue.4, pp.2258-2266, 2009. ,
URL : https://hal.archives-ouvertes.fr/hal-01430112
Soft-errors induced by terrestrial neutrons and natural alpha-particle emitters in advanced memory circuits at ground level, Microelectronics Reliability, vol.50, pp.1822-1831, 2010. ,
URL : https://hal.archives-ouvertes.fr/hal-01430102
Real-Time Soft-Error Testing of 40nm SRAMs, International Reliability Physics Symposium (IRPS'2012), pp.3-5, 2012. ,
URL : https://hal.archives-ouvertes.fr/hal-01430086
Soft-Error Rate Induced by Thermal and Low Energy Neutrons in 40 nm SRAMs, IEEE Transactions on Nuclear Science, vol.59, issue.6, pp.2658-2665, 2012. ,
URL : https://hal.archives-ouvertes.fr/hal-01430089
Soft Errors Induced by Natural Radiation at Ground Level in Floating Gate Flash Memories, International Reliability Physics Symposium (IRPS'2013), pp.3-4, 2013. ,
URL : https://hal.archives-ouvertes.fr/hal-01430082