Journal Articles
IEEE Solid-State Circuits Letters
Year : 2018
Jean-Luc Autran : Connect in order to contact the contributor
https://hal-amu.archives-ouvertes.fr/hal-02111066
Submitted on : Thursday, April 25, 2019-5:26:56 PM
Last modification on : Wednesday, November 3, 2021-7:28:55 AM
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Martin Cochet, Ben Keller, Sylvain Clerc, Fady Abouzeid, Andreia Cathelin, et al.. A 225 μm2 Probe Single-Point Calibration Digital Temperature Sensor Using Body-Bias Adjustment in 28 nm FD-SOI CMOS. IEEE Solid-State Circuits Letters, 2018, 1 (1), pp.14-17. ⟨10.1109/LSSC.2018.2797427⟩. ⟨hal-02111066⟩
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