A 225 μm2 Probe Single-Point Calibration Digital Temperature Sensor Using Body-Bias Adjustment in 28 nm FD-SOI CMOS - Archive ouverte HAL Access content directly
Journal Articles IEEE Solid-State Circuits Letters Year : 2018

A 225 μm2 Probe Single-Point Calibration Digital Temperature Sensor Using Body-Bias Adjustment in 28 nm FD-SOI CMOS

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hal-02111066 , version 1 (25-04-2019)

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Martin Cochet, Ben Keller, Sylvain Clerc, Fady Abouzeid, Andreia Cathelin, et al.. A 225 μm2 Probe Single-Point Calibration Digital Temperature Sensor Using Body-Bias Adjustment in 28 nm FD-SOI CMOS. IEEE Solid-State Circuits Letters, 2018, 1 (1), pp.14-17. ⟨10.1109/LSSC.2018.2797427⟩. ⟨hal-02111066⟩
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