A 225 μm2 Probe Single-Point Calibration Digital Temperature Sensor Using Body-Bias Adjustment in 28 nm FD-SOI CMOS

Martin Cochet; Ben Keller; Sylvain Clerc; Fady Abouzeid; Andreia Cathelin; Jean-Luc Autran; Philippe Roche; Borivoje Nikolic

doi:10.1109/LSSC.2018.2797427

Journal articles

A 225 μm2 Probe Single-Point Calibration Digital Temperature Sensor Using Body-Bias Adjustment in 28 nm FD-SOI CMOS

Martin Cochet ¹ Ben Keller Sylvain Clerc ² Fady Abouzeid ² Andreia Cathelin ² Jean-Luc Autran ¹ Philippe Roche ² Borivoje Nikolic

1 IM2NP - Institut des Matériaux, de Microélectronique et des Nanosciences de Provence

2 ST-CROLLES - STMicroelectronics [Crolles]

Document type :

Journal articles

Domain :

Engineering Sciences [physics] / Micro and nanotechnologies/Microelectronics

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https://hal-amu.archives-ouvertes.fr/hal-02111066
Contributor : Jean-Luc Autran Connect in order to contact the contributor
Submitted on : Thursday, April 25, 2019 - 5:26:56 PM
Last modification on : Wednesday, November 3, 2021 - 7:28:55 AM

A 225 μm2 Probe Single-Point Calibration Digital Temperature Sensor Using Body-Bias Adjustment in 28 nm FD-SOI CMOS

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A 225 μm2 Probe Single-Point Calibration Digital Temperature Sensor Using Body-Bias Adjustment in 28 nm FD-SOI CMOS

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