Skip to Main content Skip to Navigation
Journal articles

Accurate Resolution of Time-Dependent and Circuit-Coupled Charge Transport Equations: 1-D Case Applied to 28-nm FD-SOI Devices

Abstract : We present a 1D drift-diffusion solver for single-event simulation. Owing to its computational speed and circuit-coupling ability, the module is embedded in our soft error rate simulation platform, enabling projections on logic cells in 28 nm FD-SOI.
Complete list of metadatas

Cited literature [25 references]  Display  Hide  Download

https://hal-amu.archives-ouvertes.fr/hal-02111080
Contributor : Jean-Luc Autran <>
Submitted on : Wednesday, May 1, 2019 - 10:44:11 AM
Last modification on : Monday, December 9, 2019 - 1:36:02 PM

File

TNS2018.pdf
Files produced by the author(s)

Identifiers

Collections

Citation

Victor Malherbe, Gilles Gasiot, Thomas Thery, Jean-Luc Autran, Philippe Roche. Accurate Resolution of Time-Dependent and Circuit-Coupled Charge Transport Equations: 1-D Case Applied to 28-nm FD-SOI Devices. IEEE Transactions on Nuclear Science, Institute of Electrical and Electronics Engineers, 2018, 65 (1), pp.331-338. ⟨10.1109/TNS.2017.2774960⟩. ⟨hal-02111080⟩

Share

Metrics

Record views

100

Files downloads

130