HAL will be down for maintenance from Friday, June 10 at 4pm through Monday, June 13 at 9am. More information
Skip to Main content Skip to Navigation
Journal articles

Accurate Resolution of Time-Dependent and Circuit-Coupled Charge Transport Equations: 1-D Case Applied to 28-nm FD-SOI Devices

Abstract : We present a 1D drift-diffusion solver for single-event simulation. Owing to its computational speed and circuit-coupling ability, the module is embedded in our soft error rate simulation platform, enabling projections on logic cells in 28 nm FD-SOI.
Complete list of metadata

Cited literature [25 references]  Display  Hide  Download

https://hal-amu.archives-ouvertes.fr/hal-02111080
Contributor : Jean-Luc Autran Connect in order to contact the contributor
Submitted on : Wednesday, May 1, 2019 - 10:44:11 AM
Last modification on : Wednesday, November 3, 2021 - 7:27:43 AM

File

TNS2018.pdf
Files produced by the author(s)

Identifiers

Collections

Citation

Victor Malherbe, Gilles Gasiot, Thomas Thery, Jean-Luc Autran, Philippe Roche. Accurate Resolution of Time-Dependent and Circuit-Coupled Charge Transport Equations: 1-D Case Applied to 28-nm FD-SOI Devices. IEEE Transactions on Nuclear Science, Institute of Electrical and Electronics Engineers, 2018, 65 (1), pp.331-338. ⟨10.1109/TNS.2017.2774960⟩. ⟨hal-02111080⟩

Share

Metrics

Record views

40

Files downloads

86