Accurate Resolution of Time-Dependent and Circuit-Coupled Charge Transport Equations: 1-D Case Applied to 28-nm FD-SOI Devices

Victor Malherbe; Gilles Gasiot; Thomas Thery; Jean-Luc Autran; Philippe Roche

doi:10.1109/TNS.2017.2774960

Journal articles

Accurate Resolution of Time-Dependent and Circuit-Coupled Charge Transport Equations: 1-D Case Applied to 28-nm FD-SOI Devices

Victor Malherbe ^{1, 2} Gilles Gasiot ² Thomas Thery ² Jean-Luc Autran ¹ Philippe Roche ²

1 IM2NP - Institut des Matériaux, de Microélectronique et des Nanosciences de Provence

2 ST-CROLLES - STMicroelectronics [Crolles]

Abstract : We present a 1D drift-diffusion solver for single-event simulation. Owing to its computational speed and circuit-coupling ability, the module is embedded in our soft error rate simulation platform, enabling projections on logic cells in 28 nm FD-SOI.

Document type :

Journal articles

Domain :

Engineering Sciences [physics] / Micro and nanotechnologies/Microelectronics

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https://hal-amu.archives-ouvertes.fr/hal-02111080
Contributor : Jean-Luc Autran <>
Submitted on : Wednesday, May 1, 2019 - 10:44:11 AM
Last modification on : Monday, December 9, 2019 - 1:36:02 PM

Accurate Resolution of Time-Dependent and Circuit-Coupled Charge Transport Equations: 1-D Case Applied to 28-nm FD-SOI Devices

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Accurate Resolution of Time-Dependent and Circuit-Coupled Charge Transport Equations: 1-D Case Applied to 28-nm FD-SOI Devices

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