Accurate Resolution of Time-Dependent and Circuit-Coupled Charge Transport Equations: 1-D Case Applied to 28-nm FD-SOI Devices - Archive ouverte HAL Access content directly
Journal Articles IEEE Transactions on Nuclear Science Year : 2018

Accurate Resolution of Time-Dependent and Circuit-Coupled Charge Transport Equations: 1-D Case Applied to 28-nm FD-SOI Devices

Abstract

We present a 1D drift-diffusion solver for single-event simulation. Owing to its computational speed and circuit-coupling ability, the module is embedded in our soft error rate simulation platform, enabling projections on logic cells in 28 nm FD-SOI.
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Dates and versions

hal-02111080 , version 1 (01-05-2019)

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Victor Malherbe, Gilles Gasiot, Thomas Thery, Jean-Luc Autran, Philippe Roche. Accurate Resolution of Time-Dependent and Circuit-Coupled Charge Transport Equations: 1-D Case Applied to 28-nm FD-SOI Devices. IEEE Transactions on Nuclear Science, 2018, 65 (1), pp.331-338. ⟨10.1109/TNS.2017.2774960⟩. ⟨hal-02111080⟩
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