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Investigation of Sensitivity to Heavy-Ion Irradiation of Junctionless Double-Gate MOSFETs by 3-D Numerical Simulation
https://hal-amu.archives-ouvertes.fr/hal-02119405
Contributor : Daniela Munteanu <>
Submitted on : Friday, May 3, 2019 - 5:18:19 PM
Last modification on : Tuesday, March 30, 2021 - 3:23:31 AM
Contributor : Daniela Munteanu <>
Submitted on : Friday, May 3, 2019 - 5:18:19 PM
Last modification on : Tuesday, March 30, 2021 - 3:23:31 AM
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