Daniela Munteanu, Jean-Luc Autran. Investigation of Sensitivity to Heavy-Ion Irradiation of Junctionless Double-Gate MOSFETs by 3-D Numerical Simulation. J. Awrejcewicz.
Computational and Numerical Simulations, INTECH, 2014,
⟨10.5772/57048⟩.
⟨hal-02119405⟩