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Real-Time Soft-Error Rate Characterization of Advanced SRAMs

Jean-Luc Autran 1 Daniela Munteanu 1 Sebastien Sauze 1 Philippe Roche 2 Gilles Gasiot 2 
1 IM2NP - Institut des Matériaux, de Microélectronique et des Nanosciences de Provence
2 ST-CROLLES - STMicroelectronics [Crolles]
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https://hal-amu.archives-ouvertes.fr/hal-02121292
Contributor : Daniela Munteanu Connect in order to contact the contributor
Submitted on : Monday, May 6, 2019 - 2:50:31 PM
Last modification on : Tuesday, October 19, 2021 - 11:00:03 PM

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  • HAL Id : hal-02121292, version 1

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Jean-Luc Autran, Daniela Munteanu, Sebastien Sauze, Philippe Roche, Gilles Gasiot. Real-Time Soft-Error Rate Characterization of Advanced SRAMs. K. Iniewski. Radiation Effects in Semiconductors, CRC Press, pp.225-247, 2010, 978-1-4398-2694-2. ⟨hal-02121292⟩

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