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Real-Time Soft-Error Rate Characterization of Advanced SRAMs

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https://hal-amu.archives-ouvertes.fr/hal-02121292
Contributor : Daniela Munteanu <>
Submitted on : Monday, May 6, 2019 - 2:50:31 PM
Last modification on : Tuesday, May 7, 2019 - 1:28:43 AM

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  • HAL Id : hal-02121292, version 1

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Jean-Luc Autran, Daniela Munteanu, Sebastien Sauze, Philippe Roche, Gilles Gasiot. Real-Time Soft-Error Rate Characterization of Advanced SRAMs. K. Iniewski. Radiation Effects in Semiconductors, CRC Press, pp.225-247, 2010, 978-1-4398-2694-2. ⟨hal-02121292⟩

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