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Modeling and Simulation of SEU in Bulk Si and Ge SRAM

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https://hal-amu.archives-ouvertes.fr/hal-02263530
Contributor : Daniela Munteanu <>
Submitted on : Monday, August 5, 2019 - 10:37:17 AM
Last modification on : Tuesday, August 6, 2019 - 1:15:55 AM

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Soilihi Moindjie, Daniela Munteanu, Jean-Luc Autran. Modeling and Simulation of SEU in Bulk Si and Ge SRAM. 30th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (ESREF 2019), Sep 2019, Toulouse, France. ⟨hal-02263530⟩

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