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Preparing a celadonite electron source and estimating its brightness

Abstract : SHORT ABSTRACT: The article presents a protocol to prepare the celadonite source and estimate its brightness for use in a long-range imaging low-energy electron point-source projection microscope. LONG ABSTRACT: The electron celadonite source described in this article performs well in a low-energy electron point-source projection microscope in long-range imaging. It presents major advantages compared to sharp metal tips. Its robustness affords a lifetime of months and it can be used under relatively high pressure. The celadonite crystal is deposited at the apex of a carbon fiber, maintained itself in a coaxial structure ensuring a spherical beam shape and easy mechanical positioning to align the source, the object and the electron-optical system axis. There is a single crystal deposition via generation of celadonite-containing water droplets with a micropipette. Scanning electron microscopy observation can be performed to verify the deposition. However, this adds steps and therefore increases the risk of damaging the source. Thus, after preparation, the source is usually inserted directly under vacuum in the projection microscope. A first high voltage supply provides the kick-off needed to start the electron emission. The field emission process involved is then measured: it has already been observed for dozens of electron sources prepared in this way. The brightness is underestimated through an over-estimation of source size, intensity at one energy and cone angle measured in a projection system.
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https://hal-amu.archives-ouvertes.fr/hal-02359792
Contributor : Evelyne Salançon <>
Submitted on : Tuesday, November 12, 2019 - 3:13:56 PM
Last modification on : Thursday, November 14, 2019 - 1:36:53 AM
Long-term archiving on: : Thursday, February 13, 2020 - 7:47:32 PM

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E. Salançon, Alain Degiovanni, Laurent Lapena, Roger Morin. Preparing a celadonite electron source and estimating its brightness. Journal of visualized experiments : JoVE, JoVE, 2019, 153, ⟨10.3791/59513⟩. ⟨hal-02359792⟩

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