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Journal Articles Microscopy and Microanalysis Year : 2019

Coupling Secondary Ion Mass Spectrometry and Atom Probe Tomography for Atomic Diffusion and Segregation Measurements

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hal-02381654 , version 1 (26-11-2019)

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Alain Portavoce, Khalid Hoummada, Lee Chow. Coupling Secondary Ion Mass Spectrometry and Atom Probe Tomography for Atomic Diffusion and Segregation Measurements. Microscopy and Microanalysis, 2019, 25 (02), pp.517-523. ⟨10.1017/S1431927618015623⟩. ⟨hal-02381654⟩
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