Coupling Secondary Ion Mass Spectrometry and Atom Probe Tomography for Atomic Diffusion and Segregation Measurements

Alain Portavoce; Khalid Hoummada; Lee Chow

doi:10.1017/S1431927618015623

Journal Articles Microscopy and Microanalysis Year : 2019

Coupling Secondary Ion Mass Spectrometry and Atom Probe Tomography for Atomic Diffusion and Segregation Measurements

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Alain Portavoce

Function : Author

Institut des Matériaux, de Microélectronique et des Nanosciences de Provence

Khalid Hoummada

Function : Author

Institut des Matériaux, de Microélectronique et des Nanosciences de Provence

Lee Chow

Function : Author

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Physics [physics] Condensed Matter [cond-mat] Materials Science [cond-mat.mtrl-sci]

Alain Portavoce : Connect in order to contact the contributor

https://hal-amu.archives-ouvertes.fr/hal-02381654

Submitted on : Tuesday, November 26, 2019-5:06:06 PM

Last modification on : Wednesday, November 3, 2021-7:28:20 AM

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hal-02381654 , version 1 (26-11-2019)

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HAL Id : hal-02381654 , version 1
DOI : 10.1017/S1431927618015623

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Alain Portavoce, Khalid Hoummada, Lee Chow. Coupling Secondary Ion Mass Spectrometry and Atom Probe Tomography for Atomic Diffusion and Segregation Measurements. Microscopy and Microanalysis, 2019, 25 (02), pp.517-523. ⟨10.1017/S1431927618015623⟩. ⟨hal-02381654⟩

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Coupling Secondary Ion Mass Spectrometry and Atom Probe Tomography for Atomic Diffusion and Segregation Measurements

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