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Coupling Secondary Ion Mass Spectrometry and Atom Probe Tomography for Atomic Diffusion and Segregation Measurements

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https://hal-amu.archives-ouvertes.fr/hal-02381654
Contributor : Alain Portavoce <>
Submitted on : Tuesday, November 26, 2019 - 5:06:06 PM
Last modification on : Wednesday, November 27, 2019 - 1:40:56 AM

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Alain Portavoce, Khalid Hoummada, Lee Chow. Coupling Secondary Ion Mass Spectrometry and Atom Probe Tomography for Atomic Diffusion and Segregation Measurements. Microscopy and Microanalysis, Cambridge University Press (CUP), 2019, 25 (02), pp.517-523. ⟨10.1017/S1431927618015623⟩. ⟨hal-02381654⟩

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