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Coupling Secondary Ion Mass Spectrometry and Atom Probe Tomography for Atomic Diffusion and Segregation Measurements

Alain Portavoce 1 Khalid Hoummada 1 Lee Chow
1 IM2NP - Institut des Matériaux, de Microélectronique et des Nanosciences de Provence
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https://hal-amu.archives-ouvertes.fr/hal-02381654
Contributor : Alain Portavoce Connect in order to contact the contributor
Submitted on : Tuesday, November 26, 2019 - 5:06:06 PM
Last modification on : Wednesday, November 3, 2021 - 7:28:20 AM

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UNIV-AMU | IM2NP | UNIV-TLN | CNRS

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Alain Portavoce, Khalid Hoummada, Lee Chow. Coupling Secondary Ion Mass Spectrometry and Atom Probe Tomography for Atomic Diffusion and Segregation Measurements. Microscopy and Microanalysis, Cambridge University Press (CUP), 2019, 25 (02), pp.517-523. ⟨10.1017/S1431927618015623⟩. ⟨hal-02381654⟩

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