Coupling Secondary Ion Mass Spectrometry and Atom Probe Tomography for Atomic Diffusion and Segregation Measurements - Archive ouverte HAL Access content directly
Journal Articles Microscopy and Microanalysis Year : 2019

Coupling Secondary Ion Mass Spectrometry and Atom Probe Tomography for Atomic Diffusion and Segregation Measurements

Domains

Physics [physics] Condensed Matter [cond-mat] Materials Science [cond-mat.mtrl-sci]

Alain Portavoce  : Connect in order to contact the contributor

https://hal-amu.archives-ouvertes.fr/hal-02381654

Submitted on : Tuesday, November 26, 2019-5:06:06 PM

Last modification on : Wednesday, February 8, 2023-5:11:10 PM

Not file

Dates and versions

hal-02381654 , version 1 (26-11-2019)

Identifiers

Cite

Alain Portavoce, Khalid Hoummada, Lee Chow. Coupling Secondary Ion Mass Spectrometry and Atom Probe Tomography for Atomic Diffusion and Segregation Measurements. Microscopy and Microanalysis, 2019, 25 (02), pp.517-523. ⟨10.1017/S1431927618015623⟩. ⟨hal-02381654⟩

Export

BibTeX TEI Dublin Core DC Terms EndNote Datacite

Collections

UNIV-TLN CNRS UNIV-AMU IM2NP
22 View
0 Download

Altmetric

Share

Gmail Facebook Twitter LinkedIn More