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Dynamic segregation of metallic impurities at SiO 2 /Si interfaces

A. de Luca 1 A. Portavoce 2 M. Texier 2 N. Burle 2 B Pichaud
1 CNR-IPCF - Department of Physics, Licryl
2 IM2NP - Institut des Matériaux, de Microélectronique et des Nanosciences de Provence
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https://hal-amu.archives-ouvertes.fr/hal-02385357
Contributor : Alain Portavoce Connect in order to contact the contributor
Submitted on : Thursday, November 28, 2019 - 5:27:36 PM
Last modification on : Tuesday, October 19, 2021 - 11:00:04 PM

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A. de Luca, A. Portavoce, M. Texier, N. Burle, B Pichaud. Dynamic segregation of metallic impurities at SiO 2 /Si interfaces. Journal of Physics: Conference Series, IOP Publishing, 2013, 471, pp.012029. ⟨10.1088/1742-6596/471/1/012029⟩. ⟨hal-02385357⟩

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