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Dynamic segregation of metallic impurities at SiO 2 /Si interfaces

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Contributor : Alain Portavoce Connect in order to contact the contributor
Submitted on : Thursday, November 28, 2019 - 5:27:36 PM
Last modification on : Tuesday, October 19, 2021 - 11:00:04 PM

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A. de Luca, A. Portavoce, M. Texier, N. Burle, B Pichaud. Dynamic segregation of metallic impurities at SiO 2 /Si interfaces. Journal of Physics: Conference Series, IOP Publishing, 2013, 471, pp.012029. ⟨10.1088/1742-6596/471/1/012029⟩. ⟨hal-02385357⟩

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