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Composition measurement of the Ni-silicide transient phase by atom probe tomography

K. Hoummada 1 I. Blum 1 D. Mangelinck 1 A. Portavoce 1 
1 IM2NP - Institut des Matériaux, de Microélectronique et des Nanosciences de Provence
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https://hal-amu.archives-ouvertes.fr/hal-02386090
Contributor : Alain Portavoce Connect in order to contact the contributor
Submitted on : Friday, November 29, 2019 - 10:46:25 AM
Last modification on : Tuesday, October 19, 2021 - 11:00:04 PM

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UNIV-TLN | CNRS | UNIV-AMU | IM2NP

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K. Hoummada, I. Blum, D. Mangelinck, A. Portavoce. Composition measurement of the Ni-silicide transient phase by atom probe tomography. Applied Physics Letters, American Institute of Physics, 2010, 96 (26), pp.261904. ⟨10.1063/1.3457995⟩. ⟨hal-02386090⟩

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