Composition measurement of the Ni-silicide transient phase by atom probe tomography - Archive ouverte HAL Access content directly
Journal Articles Applied Physics Letters Year : 2010
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hal-02386090 , version 1 (29-11-2019)

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K. Hoummada, I. Blum, D. Mangelinck, A. Portavoce. Composition measurement of the Ni-silicide transient phase by atom probe tomography. Applied Physics Letters, 2010, 96 (26), pp.261904. ⟨10.1063/1.3457995⟩. ⟨hal-02386090⟩
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