Journal Articles
Materials Letters
Year : 2009
Alain Portavoce : Connect in order to contact the contributor
https://hal-amu.archives-ouvertes.fr/hal-02386139
Submitted on : Friday, November 29, 2019-11:00:14 AM
Last modification on : Friday, March 24, 2023-2:53:14 PM
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A. Portavoce, N. Rodriguez, R. Daineche, C. Grosjean, C. Girardeaux. Correction of secondary ion mass spectrometry profiles for atom diffusion measurements. Materials Letters, 2009, 63 (8), pp.676-678. ⟨10.1016/j.matlet.2008.12.018⟩. ⟨hal-02386139⟩
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