Correction of secondary ion mass spectrometry profiles for atom diffusion measurements

A. Portavoce; N. Rodriguez; R. Daineche; C. Grosjean; C. Girardeaux

doi:10.1016/j.matlet.2008.12.018

Journal Articles Materials Letters Year : 2009

Correction of secondary ion mass spectrometry profiles for atom diffusion measurements

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1
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A. Portavoce

Function : Author
PersonId : 864373
ORCID : 0000-0002-6390-1637

Institut des Matériaux, de Microélectronique et des Nanosciences de Provence

N. Rodriguez

Function : Author

Universidad de Granada = University of Granada

R. Daineche

Function : Author

C. Grosjean

Function : Author

C. Girardeaux

Function : Author

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Physics [physics] Condensed Matter [cond-mat] Materials Science [cond-mat.mtrl-sci]

Alain Portavoce : Connect in order to contact the contributor

https://hal-amu.archives-ouvertes.fr/hal-02386139

Submitted on : Friday, November 29, 2019-11:00:14 AM

Last modification on : Friday, March 24, 2023-2:53:14 PM

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hal-02386139 , version 1 (29-11-2019)

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HAL Id : hal-02386139 , version 1
DOI : 10.1016/j.matlet.2008.12.018

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A. Portavoce, N. Rodriguez, R. Daineche, C. Grosjean, C. Girardeaux. Correction of secondary ion mass spectrometry profiles for atom diffusion measurements. Materials Letters, 2009, 63 (8), pp.676-678. ⟨10.1016/j.matlet.2008.12.018⟩. ⟨hal-02386139⟩

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Correction of secondary ion mass spectrometry profiles for atom diffusion measurements

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