A. Portavoce, N. Rodriguez, R. Daineche, C. Grosjean, C. Girardeaux. Correction of secondary ion mass spectrometry profiles for atom diffusion measurements.
Materials Letters, Elsevier, 2009, 63 (8), pp.676-678.
⟨10.1016/j.matlet.2008.12.018⟩.
⟨hal-02386139⟩