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Correction of secondary ion mass spectrometry profiles for atom diffusion measurements

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https://hal-amu.archives-ouvertes.fr/hal-02386139
Contributor : Alain Portavoce <>
Submitted on : Friday, November 29, 2019 - 11:00:14 AM
Last modification on : Saturday, November 30, 2019 - 1:44:35 AM

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A. Portavoce, N. Rodriguez, R. Daineche, C. Grosjean, C. Girardeaux. Correction of secondary ion mass spectrometry profiles for atom diffusion measurements. Materials Letters, Elsevier, 2009, 63 (8), pp.676-678. ⟨10.1016/j.matlet.2008.12.018⟩. ⟨hal-02386139⟩

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