Assembly and Analysis of Ordered Semiconductor Quantum Dot Arrays by Focused Ion Beam Nanofabrication and Tomography

R Hull; J. Graham; A Kubis; A. Portavoce; F Ross

doi:10.1017/S1431927607072649

Journal Articles Microscopy and Microanalysis Year : 2007

Assembly and Analysis of Ordered Semiconductor Quantum Dot Arrays by Focused Ion Beam Nanofabrication and Tomography

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R Hull

Function : Author

J. Graham

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Department of Mathematics [Berkeley]

A Kubis

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A. Portavoce

Function : Author
PersonId : 864373
ORCID : 0000-0002-6390-1637

Institut des Matériaux, de Microélectronique et des Nanosciences de Provence

F Ross

Function : Author

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Physics [physics] Condensed Matter [cond-mat] Materials Science [cond-mat.mtrl-sci]

Alain Portavoce : Connect in order to contact the contributor

https://hal-amu.archives-ouvertes.fr/hal-02386178

Submitted on : Friday, November 29, 2019-11:11:57 AM

Last modification on : Tuesday, February 7, 2023-2:45:06 PM

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hal-02386178 , version 1 (29-11-2019)

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HAL Id : hal-02386178 , version 1
DOI : 10.1017/S1431927607072649

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R Hull, J. Graham, A Kubis, A. Portavoce, F Ross. Assembly and Analysis of Ordered Semiconductor Quantum Dot Arrays by Focused Ion Beam Nanofabrication and Tomography. Microscopy and Microanalysis, 2007, 13 (S02), ⟨10.1017/S1431927607072649⟩. ⟨hal-02386178⟩

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Assembly and Analysis of Ordered Semiconductor Quantum Dot Arrays by Focused Ion Beam Nanofabrication and Tomography

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