Assembly and Analysis of Ordered Semiconductor Quantum Dot Arrays by Focused Ion Beam Nanofabrication and Tomography - Archive ouverte HAL Access content directly
Journal Articles Microscopy and Microanalysis Year : 2007

Assembly and Analysis of Ordered Semiconductor Quantum Dot Arrays by Focused Ion Beam Nanofabrication and Tomography

R Hull
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A Kubis
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F Ross
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hal-02386178 , version 1 (29-11-2019)

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R Hull, J. Graham, A Kubis, A. Portavoce, F Ross. Assembly and Analysis of Ordered Semiconductor Quantum Dot Arrays by Focused Ion Beam Nanofabrication and Tomography. Microscopy and Microanalysis, 2007, 13 (S02), ⟨10.1017/S1431927607072649⟩. ⟨hal-02386178⟩
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