Mechanism of the nanoscale localization of Ge quantum dot nucleation on focused ion beam templated Si(001) surfaces

A. Portavoce; M Kammler; R Hull; M. Reuter; F Ross

doi:10.1088/0957-4484/17/17/028

Journal articles

Mechanism of the nanoscale localization of Ge quantum dot nucleation on focused ion beam templated Si(001) surfaces

A. Portavoce ¹ M Kammler R Hull M. Reuter ² F Ross

1 IM2NP - Institut des Matériaux, de Microélectronique et des Nanosciences de Provence

2 IUP - Institute of Environmental Physics [Bremen]

Document type :

Journal articles

Domain :

Physics [physics] / Condensed Matter [cond-mat] / Materials Science [cond-mat.mtrl-sci]

Complete list of metadatas

https://hal-amu.archives-ouvertes.fr/hal-02386247
Contributor : Alain Portavoce <>
Submitted on : Friday, November 29, 2019 - 11:28:47 AM
Last modification on : Saturday, November 30, 2019 - 1:44:17 AM

Mechanism of the nanoscale localization of Ge quantum dot nucleation on focused ion beam templated Si(001) surfaces

Links full text

Identifiers

Collections

Citation

Export

Metrics

48

Mechanism of the nanoscale localization of Ge quantum dot nucleation on focused ion beam templated Si(001) surfaces

Links full text

Identifiers

Collections

Citation

Export

Share

Metrics

48