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Mechanism of the nanoscale localization of Ge quantum dot nucleation on focused ion beam templated Si(001) surfaces

A. Portavoce 1 M Kammler R Hull M. Reuter 2 F Ross 
1 IM2NP - Institut des Matériaux, de Microélectronique et des Nanosciences de Provence
2 IUP - Institute of Environmental Physics [Bremen]
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https://hal-amu.archives-ouvertes.fr/hal-02386247
Contributor : Alain Portavoce Connect in order to contact the contributor
Submitted on : Friday, November 29, 2019 - 11:28:47 AM
Last modification on : Monday, November 29, 2021 - 8:26:04 AM

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A. Portavoce, M Kammler, R Hull, M. Reuter, F Ross. Mechanism of the nanoscale localization of Ge quantum dot nucleation on focused ion beam templated Si(001) surfaces. Nanotechnology, Institute of Physics, 2006, 17 (17), pp.4451-4455. ⟨10.1088/0957-4484/17/17/028⟩. ⟨hal-02386247⟩

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