Mechanism of the nanoscale localization of Ge quantum dot nucleation on focused ion beam templated Si(001) surfaces

A. Portavoce; M Kammler; R Hull; M. Reuter; F Ross

doi:10.1088/0957-4484/17/17/028

Journal articles

Mechanism of the nanoscale localization of Ge quantum dot nucleation on focused ion beam templated Si(001) surfaces

A. Portavoce ¹ M Kammler R Hull M. Reuter ² F Ross

1 IM2NP - Institut des Matériaux, de Microélectronique et des Nanosciences de Provence

2 IUP - Institute of Environmental Physics [Bremen]

Document type :

Journal articles

Domain :

Physics [physics] / Condensed Matter [cond-mat] / Materials Science [cond-mat.mtrl-sci]

Complete list of metadata

https://hal-amu.archives-ouvertes.fr/hal-02386247
Contributor : Alain Portavoce <>
Submitted on : Friday, November 29, 2019 - 11:28:47 AM
Last modification on : Tuesday, March 30, 2021 - 3:23:58 AM

Mechanism of the nanoscale localization of Ge quantum dot nucleation on focused ion beam templated Si(001) surfaces

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Mechanism of the nanoscale localization of Ge quantum dot nucleation on focused ion beam templated Si(001) surfaces

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