Determination of the full deformation tensor by multi-Bragg fast scanning nano X-ray diffraction

Andreas Johannes (1) , Jura Rensberg (2) , Tilman A. Grünewald (3, 1) , Philipp Schöppe (4) , Maurizio Ritzer (2) , Martin Rosenthal (1) , Carsten Ronning (2) , Manfred Burghammer (1)

1 ESRF - European Synchrotron Radiation Facility
2 Friedrich-Schiller-Universität = Friedrich Schiller University Jena [Jena, Germany]
3 COMiX - Coherent Optical Microscopy and X-rays
4 Universitätsklinikum Friedrich-Schiller-University (FSU)

This work showcases a method to map the full deformation tensor in a single micro-sized crystal. It is shown that measuring the position of two Bragg reflections in reciprocal space is sufficient to obtain the full deformation tensor, if the condition of incompressibility of the material is imposed. This method is used to reveal the surface tension induced deformation at the edges of an as-grown single-crystal VO 2 microwire. All components of the deformation tensor of the microwire were measured down to an absolute value of 10 À4 in an 8 Â 14 mm projected area of the wire. With a beam-defined spatial resolution of 150 Â 150 nm, the measurement time was merely 2.5 h.

Keywords: strain; deformation tensor; nano X-ray diffraction

Domains: Condensed Matter [cond-mat]

Andreas Johannes, Jura Rensberg, Tilman A. Grünewald, Philipp Schöppe, Maurizio Ritzer, et al.. Determination of the full deformation tensor by multi-Bragg fast scanning nano X-ray diffraction. Journal of Applied Crystallography, 2020, 53 (1), pp.99-106. ⟨10.1107/S1600576719016534⟩. ⟨hal-02466436⟩