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Mohammed AL-KHARAZ : Connect in order to contact the contributor
https://hal-amu.archives-ouvertes.fr/hal-02486929
Submitted on : Friday, February 21, 2020-12:13:11 PM
Last modification on : Thursday, July 14, 2022-4:11:51 AM
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- HAL Id : hal-02486929 , version 1
- DOI : 10.1109/ICSC47195.2019.8950664
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Mohammed Al-Kharaz, Bouchra Ananou, Mustapha Ouladsine, Michel Combal, Jacques Pinaton. Quality Prediction in Semiconductor Manufacturing processes Using Multilayer Perceptron Feedforward Artificial Neural Network *. 2019 8th International Conference on Systems and Control (ICSC), Oct 2019, Marrakesh, Morocco. pp.423-428, ⟨10.1109/ICSC47195.2019.8950664⟩. ⟨hal-02486929⟩
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