Quality Prediction in Semiconductor Manufacturing processes Using Multilayer Perceptron Feedforward Artificial Neural Network * - Archive ouverte HAL Access content directly
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Quality Prediction in Semiconductor Manufacturing processes Using Multilayer Perceptron Feedforward Artificial Neural Network *

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hal-02486929 , version 1 (21-02-2020)

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Mohammed Al-Kharaz, Bouchra Ananou, Mustapha Ouladsine, Michel Combal, Jacques Pinaton. Quality Prediction in Semiconductor Manufacturing processes Using Multilayer Perceptron Feedforward Artificial Neural Network *. 2019 8th International Conference on Systems and Control (ICSC), Oct 2019, Marrakesh, Morocco. pp.423-428, ⟨10.1109/ICSC47195.2019.8950664⟩. ⟨hal-02486929⟩
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