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Quality Prediction in Semiconductor Manufacturing processes Using Multilayer Perceptron Feedforward Artificial Neural Network *

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https://hal-amu.archives-ouvertes.fr/hal-02486929
Contributor : Mohammed Al-Kharaz <>
Submitted on : Friday, February 21, 2020 - 12:13:11 PM
Last modification on : Saturday, February 22, 2020 - 1:39:21 AM

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Mohammed Al-Kharaz, Bouchra Ananou, Mustapha Ouladsine, Michel Combal, Jacques Pinaton. Quality Prediction in Semiconductor Manufacturing processes Using Multilayer Perceptron Feedforward Artificial Neural Network *. 2019 8th International Conference on Systems and Control (ICSC), Oct 2019, Marrakesh, Morocco. pp.423-428, ⟨10.1109/ICSC47195.2019.8950664⟩. ⟨hal-02486929⟩

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