Quality Prediction in Semiconductor Manufacturing processes Using Multilayer Perceptron Feedforward Artificial Neural Network *

Mohammed Al-Kharaz (1) , Bouchra Ananou (1) , Mustapha Ouladsine (1) , Michel Combal (2) , Jacques Pinaton (2)

1 PECASE - Pronostic-Diagnostic Et CommAnde : Santé et Energie
2 STMicroelectronics

Domaines: Automatique

Mohammed Al-Kharaz, Bouchra Ananou, Mustapha Ouladsine, Michel Combal, Jacques Pinaton. Quality Prediction in Semiconductor Manufacturing processes Using Multilayer Perceptron Feedforward Artificial Neural Network *. 2019 8th International Conference on Systems and Control (ICSC), Oct 2019, Marrakesh, Morocco. pp.423-428, ⟨10.1109/ICSC47195.2019.8950664⟩. ⟨hal-02486929⟩