Mohammed Al-Kharaz, Bouchra Ananou, Mustapha Ouladsine, Michel Combal, Jacques Pinaton. Indicator of Alarm Risk on Product Degradation, Prediction for Alarms Grouping, Using Alarms Data in Semiconductor Manufacturing.
58th Conference on Decision and Control (CDC), Dec 2019, Nice, France.
⟨hal-02486983⟩