X-ray coherent diffraction imaging with an objective lens: Towards three-dimensional mapping of thick polycrystals

A. Pedersen (1) , Virginie Chamard (2) , C. Detlefs (3) , T. Zhou (3) , D. Carbone (4) , H. Poulsen (1)

1 Danish Technical University
2 COMiX - Coherent Optical Microscopy and X-rays
3 ESRF - European Synchrotron Radiation Facility
4 MAX IV Lab, Fotongatan 2, S-22594 Lund, Sweden

We demonstrate an x-ray coherent imaging method that combines high spatial resolution with the ability to map grains within thick polycrystalline specimens. An x-ray objective serves to isolate an embedded grain. Iterative oversampling routines and Fourier synthesis are used to reconstruct the shape and strain field from the far-field intensity pattern. In a demonstration experiment a 500-nm Pt grain embedded in a polycrystalline Pt matrix is mapped in three dimensions without compromising the spatial resolution. No information on the pupil function of the lens is required and lens aberrations are not critical.

Domaines: Matière Condensée [cond-mat]

A. Pedersen, Virginie Chamard, C. Detlefs, T. Zhou, D. Carbone, et al.. X-ray coherent diffraction imaging with an objective lens: Towards three-dimensional mapping of thick polycrystals. Physical Review Research, 2020, 2 (3), pp.033031. ⟨10.1103/PhysRevResearch.2.033031⟩. ⟨hal-02925849⟩