HAL will be down for maintenance from Friday, June 10 at 4pm through Monday, June 13 at 9am. More information
Skip to Main content Skip to Navigation
Journal articles

Behaviour of metallic impurities at grain boundaries and dislocation clusters in multicrystalline silicon wafers deduced from contactless lifetime scan maps

Document type :
Journal articles
Complete list of metadata

https://hal-amu.archives-ouvertes.fr/hal-03350292
Contributor : Olivier Palais Connect in order to contact the contributor
Submitted on : Tuesday, September 21, 2021 - 11:12:01 AM
Last modification on : Tuesday, October 19, 2021 - 11:00:04 PM

Links full text

Identifiers

Collections

Citation

P Hidalgo, O Palais, S Martinuzzi. Behaviour of metallic impurities at grain boundaries and dislocation clusters in multicrystalline silicon wafers deduced from contactless lifetime scan maps. Journal of Physics: Condensed Matter, IOP Publishing, 2004, 16 (2), pp.S19-S24. ⟨10.1088/0953-8984/16/2/003⟩. ⟨hal-03350292⟩

Share

Metrics

Record views

11