O. Palais, L. Clerc, A. Arcari, M. Stemmer, S. Martinuzzi. Mapping of minority carrier lifetime and mobility in imperfect silicon wafers.
Materials Science and Engineering: B, Elsevier, 2003, 102 (1-3), pp.184-188.
⟨10.1016/S0921-5107(02)00652-9⟩.
⟨hal-03350299⟩